Thickness correlated effects of the crystal and surface structure of C60 thin films grown on mica by hot wall epitaxy

Thin Solid Films

Volumn 280, Issue 1-2, 1996, Pages 83-85

  Stifter, D ^a   Sitter, H ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Epitaxy; Fullerenes; Mica; Surface structure

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACKS; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; FULLERENES; IMAGE PROCESSING; MICA; MORPHOLOGY; SURFACE STRUCTURE; THICKNESS MEASUREMENT;

DIGITAL IMAGE PROCESSING; HOT WALL EPITAXY; RECIPROCAL SPACE MAPS; STRUCTURAL PROPERTIES;

THIN FILMS;

EID: 0030194275     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08215-8     Document Type: Article

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