The dependence of the crystalline quality of C60 films on helium gas pressure

Materials Letters

Volumn 31, Issue 3-6, 1997, Pages 297-301

  Ma, Guobin ^a   Yang, Yinghu ^a   Chen, Guanghua ^b  

^a LANZHOU UNIVERSITY   (China)

^b BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

C60; Helium gas; Oriented films; X ray diffraction

Indexed keywords

FILMS; HELIUM; SUPERSATURATION; X RAY DIFFRACTION ANALYSIS;

FULLERENE FILMS; ORIENTED FILMS;

FULLERENES;

EID: 0031162053     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(96)00289-3     Document Type: Article

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