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Volumn 164, Issue , 2000, Pages 705-714
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Negative cluster ions in sputtering of Si, SiC and graphite: Abundance distributions, energy spectra and fragmentation processes
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Author keywords
[No Author keywords available]
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Indexed keywords
GRAPHITE;
ION BOMBARDMENT;
MASS SPECTROMETRY;
NEGATIVE IONS;
SILICON;
SILICON CARBIDE;
SPECTRUM ANALYSIS;
FRAGMENTATION;
UNIMOLECULAR DECOMPOSITION;
SPUTTERING;
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EID: 0033748635
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(99)01116-7 Document Type: Article |
Times cited : (18)
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References (38)
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