Fragmentation of cluster ions in SIMS: Cluster distributions over lifetime, excitation energy and kinetic energy release

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 114, Issue 3-4, 1996, Pages 245-251

  Dzhemilev, N Kh ^a   Goldenberg, A M ^a   Veriovkin, I V ^a   Verkhoturov, S V ^a  

^a Institute of Electronics   (Uzbekistan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DISSOCIATION; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; TANTALUM; XENON;

CLUSTERS; FRAGMENTATION; KINETIC ENERGY RELEASE;

IONS;

EID: 0030189051     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01340-7     Document Type: Article

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