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Volumn 105, Issue 14, 1996, Pages 5999-6007

Cluster formation in sputtering: A molecular dynamics study using the MD/MC-corrected effective medium potential

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001407754     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.472451     Document Type: Article
Times cited : (89)

References (50)
  • 18
    • 0012543956 scopus 로고
    • edited by A. Benninghoven, Y. Nihei, R. Shimizu, and H. W. Werner Wiley, Chichester
    • Y. Yamamura, Secondary Ion Mass Spectrometry SIMS IX, edited by A. Benninghoven, Y. Nihei, R. Shimizu, and H. W. Werner (Wiley, Chichester, 1994), p. 3
    • (1994) Secondary Ion Mass Spectrometry SIMS IX , pp. 3
    • Yamamura, Y.1
  • 40


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.