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Volumn 39, Issue 3 A, 2000, Pages 1371-1377

Mechanism of nitrogen incorporation into amorphous-CNx films formed by plasma-enhanced chemical-vapor deposition of the doublet and quartet states of the CN radical

Author keywords

Amorphous CNx films; Chemical vapor deposition; CN; Electronic states; Mechanism of film formation; Microwave plasma; Optical emission spectroscopy; Rf plasma

Indexed keywords

CHEMICAL BONDS; CYANIDES; DISSOCIATION; ELECTRON ENERGY LEVELS; EMISSION SPECTROSCOPY; FREE RADICALS; MOLECULAR STRUCTURE; NITROGEN; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

EID: 0033742983     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.1371     Document Type: Article
Times cited : (40)

References (40)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.