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Volumn 39, Issue 3 A, 2000, Pages 1371-1377
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Mechanism of nitrogen incorporation into amorphous-CNx films formed by plasma-enhanced chemical-vapor deposition of the doublet and quartet states of the CN radical
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Author keywords
Amorphous CNx films; Chemical vapor deposition; CN; Electronic states; Mechanism of film formation; Microwave plasma; Optical emission spectroscopy; Rf plasma
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Indexed keywords
CHEMICAL BONDS;
CYANIDES;
DISSOCIATION;
ELECTRON ENERGY LEVELS;
EMISSION SPECTROSCOPY;
FREE RADICALS;
MOLECULAR STRUCTURE;
NITROGEN;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
DOUBLET STATE;
MICROWAVE PLASMA;
QUARTET STATE;
AMORPHOUS FILMS;
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EID: 0033742983
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.39.1371 Document Type: Article |
Times cited : (40)
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References (40)
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