-
1
-
-
0024681332
-
Subpicosecond InP/InGaAs heterojunction bipolar transistors
-
Y. K. Chen et alSubpicosecond InP/InGaAs heterojunction bipolar transistors IEEE Electron Device Lett., vol. 10, 267-269, 1989.
-
(1989)
IEEE Electron Device Lett.
, vol.10
, pp. 267-269
-
-
Chen, Y.K.1
-
2
-
-
36449004980
-
Anomalous electric field and temperature dependence of collector multiplication in InP/In0.47Ga0.53As heterojunction bipolar transistors
-
D. Ritter, R. A. Hamm, A. Feygenson, and M. P. PanishAnomalous electric field and temperature dependence of collector multiplication in InP/In0.47Ga0.53As heterojunction bipolar transistors Appl. Phys. Lett., vol. 60, 3150-3152, 1992.
-
(1992)
Appl. Phys. Lett.
, vol.60
, pp. 3150-3152
-
-
Ritter, D.1
Hamm, R.A.2
Feygenson, A.3
Panish, M.P.4
-
3
-
-
36449005086
-
Measurement of the electron ionization coefficient at low electric fields in InGaAs-based heterojunction bipolar transistors
-
C. Canali et al.Measurement of the electron ionization coefficient at low electric fields in InGaAs-based heterojunction bipolar transistors Appl. Phys. Lett., vol. 66, 1095-1097, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 1095-1097
-
-
Canali, C.1
-
4
-
-
0028483175
-
Fabrication and characterization of high-performance InP/InGaAs double-heterojunction bipolar transistors
-
K. Kurishima, H. Nakajima, T. Kobayashi, Y. Matsuoka, and T. IshibashiFabrication and characterization of high-performance InP/InGaAs double-heterojunction bipolar transistors IEEE Trans. Electron Devices, vol. 41, 1319-1326, 1994.
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, pp. 1319-1326
-
-
Kurishima, K.1
Nakajima, H.2
Kobayashi, T.3
Matsuoka, Y.4
Ishibashi, T.5
-
5
-
-
0026826271
-
InGaAs/InP composite collector heterojunction bipolar transistors
-
A. Feygenson et al.InGaAs/InP composite collector heterojunction bipolar transistors Electron. Lett., vol. 28, 607-609, 1992.
-
(1992)
Electron. Lett.
, vol.28
, pp. 607-609
-
-
Feygenson, A.1
-
6
-
-
0031259220
-
A high-performance AlInAs/InGaAs/InP DHBT K-band power cell
-
R. S. Virk et al.A high-performance AlInAs/InGaAs/InP DHBT K-band power cell IEEE Microwave Guided Wave Lett., vol. 7, 323-325, 1997.
-
(1997)
IEEE Microwave Guided Wave Lett.
, vol.7
, pp. 323-325
-
-
Virk, R.S.1
-
8
-
-
36449005581
-
Thresholds of impact ionization in semiconductors
-
J. Bude and K. HessThresholds of impact ionization in semiconductors/ Appl. Phys., vol. 72, 3554-3561, 1992.
-
(1992)
/ Appl. Phys.
, vol.72
, pp. 3554-3561
-
-
Bude, J.1
Hess, K.2
-
9
-
-
0027187369
-
Breakdown-speed considerations in InP/InGaAs single- And double-heterostructure bipolar transistors
-
Jan.
-
H.-F. Chau, D. Pavilidis, J. Hu, and K. TomizawaBreakdown-speed considerations in InP/InGaAs single- and double-heterostructure bipolar transistors IEEE Trans. Electron Devices, vol. 40, 2-8, Jan. 1993.
-
(1993)
IEEE Trans. Electron Devices
, vol.40
, pp. 2-8
-
-
Chau, H.-F.1
Pavilidis, D.2
Hu, J.3
Tomizawa, K.4
-
10
-
-
0027187834
-
InP double heterostructure bipolar transistors with a quaternary collector for improved breakdown behavior
-
Z.-E. Abid, W. R. Mckinnon, S. P. McAlister, and M. DaviesInP double heterostructure bipolar transistors with a quaternary collector for improved breakdown behavior in Proc. 5th Int. Conf. Indium Phosphide and Related Materials, 1993, 432-434.
-
(1993)
In Proc. 5th Int. Conf. Indium Phosphide and Related Materials
, pp. 432-434
-
-
Abid, Z.-E.1
Mckinnon, W.R.2
McAlister, S.P.3
Davies, M.4
-
11
-
-
0000744721
-
Use of dipole doping to suppress switching in indium phosphide double heterojunction bipolar transistors
-
S. P. McAlist, W. R. Mckinnon, R. Driad, and A. P. RenaudUse of dipole doping to suppress switching in indium phosphide double heterojunction bipolar transistors J. Appl. Phys., vol. 82, 5231-5234, 1997.
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 5231-5234
-
-
McAlist, S.P.1
Mckinnon, W.R.2
Driad, R.3
Renaud, A.P.4
-
12
-
-
0026867535
-
Negative base current and impact ionization phenomena in AlGaAs/GaAs HBT's
-
E. Zanoni et al.Negative base current and impact ionization phenomena in AlGaAs/GaAs HBT's IEEE Electron Device Lett., vol. 13, 253-255, 1992.
-
(1992)
IEEE Electron Device Lett.
, vol.13
, pp. 253-255
-
-
Zanoni, E.1
-
13
-
-
0032095522
-
Avalanche Multiplication in InGaP/GaAs single heterojunction bipolar transistors
-
R. M. Flicroft, J. P. R. David, P. A. Houston, and C. C. ButtonAvalanche Multiplication in InGaP/GaAs single heterojunction bipolar transistors IEEE Trans. Electron Devices, vol. 45, 1207-1212, 1998.
-
(1998)
IEEE Trans. Electron Devices
, vol.45
, pp. 1207-1212
-
-
Flicroft, R.M.1
David, J.P.R.2
Houston, P.A.3
Button, C.C.4
-
15
-
-
9444287420
-
Physics of avalanche photodiodes Semicond
-
F. CapassoPhysics of avalanche photodiodes Semicond. Semimetals, vol. 22, 1-172, 1985.
-
(1985)
Semimetals
, vol.22
, pp. 1-172
-
-
Capasso, F.1
-
16
-
-
0001361517
-
Electron and hole impact ionization coefficients in InP determined by photomultiplication measurements
-
L. W. Cook, G. E. Bulman, and G. E. StillmanElectron and hole impact ionization coefficients in InP determined by photomultiplication measurements A/J/JJ. Phys. Lett., vol. 40, 589-591, 1982.
-
(1982)
A/J/JJ. Phys. Lett.
, vol.40
, pp. 589-591
-
-
Cook, L.W.1
Bulman, G.E.2
Stillman, G.E.3
-
17
-
-
0001516760
-
Impact ionization rates for electrons and holes in Gao.47lno.53As
-
T. P. PearsallImpact ionization rates for electrons and holes in Gao.47lno.53As Appl. Phys. Lett., vol. 36, 218-220, 1980.
-
(1980)
Appl. Phys. Lett.
, vol.36
, pp. 218-220
-
-
Pearsall, T.P.1
-
18
-
-
33747289191
-
Theoretical and experimental DC characterization of InGaAs-based abrupt emitter HBT's
-
K. Yang, J. C. Cowles, J. R. East, and G. I. HaddadTheoretical and experimental DC characterization of InGaAs-based abrupt emitter HBT's IEEE Trans. Electron Devices, vol. 42, 1047-1058, 1995.
-
(1995)
IEEE Trans. Electron Devices
, vol.42
, pp. 1047-1058
-
-
Yang, K.1
Cowles, J.C.2
East, J.R.3
Haddad, G.I.4
-
19
-
-
0030290947
-
Experimental and monte carlo analysis of impact-ionization in AlGaAs/GaAs HBT's
-
C. Canali etalExperimental and monte carlo analysis of impact-ionization in AlGaAs/GaAs HBT's IEEE Trans. Electron Devices, vol. 43, 1769-1777, 1996.
-
(1996)
IEEE Trans. Electron Devices
, vol.43
, pp. 1769-1777
-
-
Canali Etal, C.1
-
20
-
-
0027883389
-
Prediction of impact-ionization-induced snap-back in advanced Si n-p-n BJT's by means of a nonlocal analytical model for the avalanche multiplication factor
-
G. Verzellesi et alPrediction of impact-ionization-induced snap-back in advanced Si n-p-n BJT's by means of a nonlocal analytical model for the avalanche multiplication factor IEEE Trans. Electron Devices, vol. 40, 2296-2300, 1993.
-
(1993)
IEEE Trans. Electron Devices
, vol.40
, pp. 2296-2300
-
-
Verzellesi, G.1
-
21
-
-
0025576799
-
The impact ionization of nonequilibrium transport on breakdown and transit time in bipolar transistors
-
E. F. Crabbé et alThe impact ionization of nonequilibrium transport on breakdown and transit time in bipolar transistors in IEDM Tech. Dig., 1990, 463-466.
-
In IEDM Tech. Dig., 1990
, pp. 463-466
-
-
Crabbé, E.F.1
-
22
-
-
0001839302
-
Extension of impact-ionization multiplication coefficient measurements to high electric fields in advanced Si BJT's
-
E. Zanoni etal.Extension of impact-ionization multiplication coefficient measurements to high electric fields in advanced Si BJT's IEEE Electron Device Lett., vol. 14, 69-71, 1993.
-
(1993)
IEEE Electron Device Lett.
, vol.14
, pp. 69-71
-
-
Zanoni Etal, E.1
-
23
-
-
0028513718
-
Carrier relaxation in InGaAs heterostructures
-
G. Sucha et al.Carrier relaxation in InGaAs heterostructures Appl. Phys. Lett., vol. 65, 1486-1488, 1994.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 1486-1488
-
-
Sucha, G.1
-
24
-
-
0346892524
-
High density femtosecond excitation of hot carrier distribution in InP and InGaAs
-
W. Kutt, K. Sci.bert, and H. Kurz et al.High density femtosecond excitation of hot carrier distribution in InP and InGaAs in Uttrafast Phenomena VI, T. Yajima et al., Eds. Berlin, Germany: Springer-Verlag, 1988, 233-235.
-
Uttrafast Phenomena VI, T. Yajima Et Al., Eds. Berlin, Germany: Springer-Verlag, 1988
, pp. 233-235
-
-
Kutt, W.1
Sci.bert, K.2
Kurz, H.3
-
28
-
-
0028498191
-
Measurement of the electron ionization coefficient at low electric fields in GaAs-based heterojunction bipolar transistors
-
C. Canali et al.Measurement of the electron ionization coefficient at low electric fields in GaAs-based heterojunction bipolar transistors IEEE Electron Device Lett., vol. 15, 354-356, 1994.
-
(1994)
IEEE Electron Device Lett.
, vol.15
, pp. 354-356
-
-
Canali, C.1
-
29
-
-
0025491492
-
Influence of base thickness on collector breakdown in abrupt AHnAs/InGaAs heterostructure bipolar transistors
-
B. Jalali et al.Influence of base thickness on collector breakdown in abrupt AHnAs/InGaAs heterostructure bipolar transistors IEEE Electron Device Lett., vol. 11, 400-402, 1990.
-
(1990)
IEEE Electron Device Lett.
, vol.11
, pp. 400-402
-
-
Jalali, B.1
-
30
-
-
0000680754
-
Direct measurement of ballistic electron distribution and relaxation length in InP-based heterojunction bipolar transistors using electroluminescence spectroscopy
-
R. Teissier, J.-L. Pelouard, and F. MollotDirect measurement of ballistic electron distribution and relaxation length in InP-based heterojunction bipolar transistors using electroluminescence spectroscopy Appl. Phys. Lett., vol. 72, 2730-2732, 1998.
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 2730-2732
-
-
Teissier, R.1
Pelouard, J.-L.2
Mollot, F.3
-
31
-
-
33749936720
-
Nonequilibrium électron transport in heterojunction bipolar transistors
-
A. F. J. LeviNonequilibrium électron transport in heterojunction bipolar transistors in InP HBTs: Growth, Processing, and Applications, B. Jalali and S. J. Pearton, Eds. Norwood, MA: Artech House, 1995, ch. 4.
-
In InP HBTs: Growth, Processing, and Applications, B. Jalali and S. J. Pearton, Eds. Norwood, MA: Artech House, 1995, Ch. 4.
-
-
Levi, A.F.J.1
-
32
-
-
0024751372
-
Breakdown behavior of GaAs/AlGaAs HBT's
-
J. J. Chen, G.-B. Gao, J.-I. Chyi, and H. MorkocBreakdown behavior of GaAs/AlGaAs HBT's IEEE Trans. Electron Devices, vol. 36, 2165-2172, 1989.
-
(1989)
IEEE Trans. Electron Devices
, vol.36
, pp. 2165-2172
-
-
Chen, J.J.1
Gao, G.-B.2
Chyi, J.-I.3
Morkoc, H.4
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