Experimental and Monte Carlo analysis of impact-ionization in AlGaAs/GaAs HBT's

IEEE Transactions on Electron Devices

Volumn 43, Issue 11, 1996, Pages 1769-1777

  Canali, Claudio ^a   Pavan, Paolo ^a   Di Carlo, Aldo ^a   Lugli, Paolo ^a   Malik, Roger ^a   Manfredi, Manfredo ^a   Neviani, Andrea ^a   Vendrame, Loris ^a   Zanoni, Enrico ^a   Zandler, Gunther ^a  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC FIELD EFFECTS; HOT CARRIERS; IONIZATION OF SOLIDS; LIGHT EMISSION; MONTE CARLO METHODS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

DEAD SPACE EFFECTS; IMPACT IONIZATION; KIRK EFFECTS;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0030290947     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.542420     Document Type: Article

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