In situ visualization and analysis of silicon carbide physical vapor transport growth using digital X-ray imaging

Journal of Crystal Growth

Volumn 216, Issue 1, 2000, Pages 263-272

  Wellmann, P J ^a   Bickermann, M ^a   Hofmann, D ^a   Kadinski, L ^a   Selder, M ^a   Straubinger, T L ^a   Winnacker, A ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; DEGRADATION; IMAGING TECHNIQUES; MORPHOLOGY; VISUALIZATION;

X-RAY DETECTOR; X-RAY IMAGING;

SILICON CARBIDE;

EID: 0033720665     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00372-9     Document Type: Article

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