Proton SEU rate predictions

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 570-575

  McNulty, P J ^a   Savage, M W ^a   Roth, D R ^a   Foster, C C ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; ELECTRONICS PACKAGING; HEAVY IONS; INTEGRATED CIRCUIT TESTING; PROTON IRRADIATION; RANDOM ACCESS STORAGE; SILICON ON INSULATOR TECHNOLOGY;

CHARGE COLLECTION MEASUREMENTS; COMMERCIAL OFF THE SHELF PARTS; SECONDARY PARTICLES; SINGLE EVENT UPSET;

RADIATION EFFECTS;

EID: 0031636282     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)