Effect of the angle of incidence on proton induced single events in devices - a critical assessment by modeling

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 546-552

  Akkerman, A ^a   Barak, J ^a   Levinson, J ^a   Lifshitz, Y ^a  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; MONTE CARLO METHODS; PROTON IRRADIATION; RADIATION DETECTORS; SEMICONDUCTING SILICON;

SINGLE EVENT UPSET; SURFACE BARRIER DETECTORS;

RADIATION EFFECTS;

EID: 0031624932     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)