Properties of interfaces between SrTiO3 thin films and electrodes

Integrated Ferroelectrics

Volumn 29, Issue 1-2, 2000, Pages 53-61

  Clark, Anna M ^a   Hao, J H ^a   Si, Weidong ^a   Xi, X X ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Schottky barriers; Strontium titanate: Dielectric loss

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRODES; FILM GROWTH; INTERFACES (MATERIALS); LANTHANUM COMPOUNDS; PERMITTIVITY; PHASE TRANSITIONS; SCHOTTKY BARRIER DIODES; THERMAL EFFECTS; THIN FILMS;

LANTHANUM ALUMINUM OXIDES; QUANTUM FLUCTUATIONS; STRONTIUM RUTHENIUM OXIDES; STRONTIUM TITANATE;

STRONTIUM COMPOUNDS;

EID: 0033645090     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584580008216674     Document Type: Article

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