A self-assembled monolayer of a fluorescent guest for the screening of host molecules

Chemical Communications

Volumn , Issue 21, 1999, Pages 2229-2230

  Flink, Simon ^a   Van Veggel, Frank C J M ^a   Reinhoudt, David N ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BETA CYCLODEXTRIN; DANSYL CHLORIDE;

ARTICLE; CHEMICAL BINDING; ELECTROCHEMISTRY; FLUORESCENCE SPECTROSCOPY; MOLECULAR INTERACTION; STRUCTURE ACTIVITY RELATION; SYNTHESIS;

EID: 0033533948     PISSN: 13597345     EISSN: None     Source Type: Journal    
DOI: 10.1039/a906563f     Document Type: Article

References (19)

1. Comprehensive Supramolecular Chemistry, ed. J. L. Atwood, J. E. D. Davies, D. D. MacNicol and F. Vögtle, Pergamon, Oxford, 1996.
2. P. Timmerman and D. N. Reinhoudt, Adv. Mater., 1999, 11, 71; W. C. Still, Acc. Chem. Res., 1996, 29, 155.
3. P. Timmerman and D. N. Reinhoudt, Adv. Mater., 1999, 11, 71; W. C. Still, Acc. Chem. Res., 1996, 29, 155.
4. R. C. Sabapathy, S. Bhattachatyya, W. E. Cleland, Jr. and C. L. Hussey, Langmuir, 1998, 14, 3797; H. Ju and D. Leech, Langmuir, 1998, 14, 300; L. Zhang, L. A. Godinez, T. Lu, G. W. Gokel and A. E. Kaifer, Angew. Chem., Int. Ed. Engl., 1995, 34, 235.
5. R. C. Sabapathy, S. Bhattachatyya, W. E. Cleland, Jr. and C. L. Hussey, Langmuir, 1998, 14, 3797; H. Ju and D. Leech, Langmuir, 1998, 14, 300; L. Zhang, L. A. Godinez, T. Lu, G. W. Gokel and A. E. Kaifer, Angew. Chem., Int. Ed. Engl., 1995, 34, 235.
6. R. C. Sabapathy, S. Bhattachatyya, W. E. Cleland, Jr. and C. L. Hussey, Langmuir, 1998, 14, 3797; H. Ju and D. Leech, Langmuir, 1998, 14, 300; L. Zhang, L. A. Godinez, T. Lu, G. W. Gokel and A. E. Kaifer, Angew. Chem., Int. Ed. Engl., 1995, 34, 235.
7. R. A. Potyrailo, R. C. Conrad, A. D. Ellington and G. M. Hieftje, Anal. Chem., 1998, 70, 3419.
8. K. Motesharei and D. C. Myles, J. Am. Chem. Soc., 1998, 120, 7328.
9. D. G. Kurth and T. Bein, Langmuir, 1993, 9, 2965.
10. 3.
11. Ellipsometry was performed on a Plasmos Ellipsometer (λ = 633 nm) assuming a refractive index of 1.46 for the monolayer and the underlying oxide. The thickness of the silicon oxide layer was measured separately on an unmodified part of the same wafer and subtracted from the total layer thickness determined for the monolayer covered silicon substrate.
12. Experimental details of the contact angle measurements are described in S. Flink, B. A. Boukamp, A. van den Berg, F. C. J. M. van Veggel and D. N. Reinhoudt, J. Am. Chem. Soc., 1998, 120, 4652.
13. Absorption measurements were performed on a Hewlett Packard 8452A Diode Array Spectrophotometer. The quartz slides were coated with a SAM on each side of the substrate, so that the presented absorption spectra are due to two monolayers. An unmodified quartz slide was used as a blank.
14. 2 was determined by J. H. Moon, J. H. Kim, K. Kim, T.-H. Kang, B. Kim, C.-H. Kim, J. H. Hahn and J. W. Park, Langmuir, 1997, 13, 4305.
15. Fluorescence emission and excitation spectra were measured with a SLM Instruments SPF-500C spectrofluorometer. The presented emission spectra were recorded after excitation at 350 nm with excitation and emission bandwidths of 7.5 nm.
16. F. Grieser, P. Thistlethwaite, R. Urquhart and L. K. Patterson, J. Phys. Chem., 1987, 91, 5286.
17. T. Kinoshita, F. Iinuma and A. Tsuji, Chem. Pharm. Bull., 1974, 22, 2413.
18. R. A. Dunbar and F. V. Bright, Supramol. Chem., 1994, 3, 93.
19. K. A. Connors, Binding Constants, Wiley, New York, 1987.