Electrochemical detection of electrochemically inactive cations by self-assembled monolayers of crown ethers

Journal of the American Chemical Society

Volumn 120, Issue 19, 1998, Pages 4652-4657

  Flink, Simon ^a   Boukamp, Bernard A ^a   Van Den Berg, Albert ^b   Van Veggel, Frank C J M ^a   Reinhoudt, David N ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CATION; ETHER DERIVATIVE;

ARTICLE; COMPLEX FORMATION; ELECTROCHEMICAL ANALYSIS; MOLECULAR INTERACTION; POTENTIOMETRY;

EID: 0032550650     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja9734713     Document Type: Article

References (55)

1. (a) Ulman, A. An Introduction into Ultrathin Organic Films; Academic Press: San Diego, CA, 1991.
2. (b) Finklea, H. O. In Electroanalytical Chemistry; Bard, A. J., Rubinstein, I., Eds.; Marcel Dekker: New York, 1996; Vol. 19.
3. (a) Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559.
4. (b) Nuzzo, R. G.; Fusco, F. A.; Allara, D. L. J. Am. Chem. Soc. 1987, 109, 2358.
5. (c) Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321.
6. (d) Chidsey, C. E. D.; Loiacono, D. N. Langmuir 1990, 6, 682.
7. Thoden van Velzen, E. U.; Engbersen, J. F. J.; de Lange, P. J.; Mahy, J. W. G.; Reinhoudt, D. N. J. Am. Chem. Soc. 1995, 117, 6853.
8. (b) Huisman, B.-H.; Thoden van Velzen, E. U.; van Veggel, F. C. J. M.; Engbersen, J. F. J.; Reinhoudt, D. N. Tetrahedron Lett. 1995, 36, 3273.
9. (c) Beulen, M. W. J.; Huisman, B.-H.; van der Heijden, P. A.; van Veggel, F. C. J. M.; Simons, M. G.; Biemond, E. M. E. F.; de Lange, P. J.; Reinhoudt, D. N. Langmuir 1996, 12, 6170.
10. (d) Schönherr, H.; Vancso, G. J.; Huisman, B.-H.; van Veggel, F. C. J. M.; Reinhoudt, D. N. Langmuir 1997, 13, 1567.
11. (a) Hickman, J. J.; Ofer, D.; Laibinis, P. E.; Whitesides, G. M.; Wrighton, M. S. Science 1991, 252, 688.
12. (b) Roscoe, S. B.; Kakkar, A. K.; Marks, T. J.; Malik, A.; Durbin, M. K.; Lin, W.; Wong, G. K.; Dutta, P. Langmuir 1996, 12, 4218.
13. (c) Yang, X.; McBranch, D.; Swanson, B.; Li, D. Angew. Chem., Int. Ed. Engl. 1996, 35, 538.
14. (d) Doron, A.; Portnoy, M.; Lion-Dagan, M.; Katz, E.; Willner, I. J. Am. Chem. Soc. 1996, 118, 8937.
15. (a) Schierbaum, K.-D.; Weiss, T.; Thoden van Velzen, E. U.; Engbersen, J. F. J.; Reinhoudt, D. N.; Göpel, W. Science 1994, 265, 1413.
16. (b) Huisman, B.-H.; Kooyman, R. P. H.; van Veggel, F. C. J. M.; Reinhoudt, D. N. Adv. Mater. 1996, 8, 561.
17. (a) Spinke, J.; Liley, M.; Schmitt, F.-J.; Guder, H.-J.; Angermaier, L.; Knoll, W. J. Chem. Phys. 1993, 99, 7012.
18. (b) Roush, J. A.; Tacker, D. L.; Anderson, M. R. Langmuir 1994, 10, 1642.
19. (c) Sastry, M.; Patil, V.; Mayya, K. S. J. Phys. Chem. B 1997, 101, 1167.
20. (d) Ebara, Y.; Itakura, K.; Okahata, Y. Langmuir 1996, 12, 5165.
21. (a) Rubinstein, I.; Steinberg, S.; Tor, Y.; Shanzer, A.; Sagiv, J. Nature 1988, 332, 426.
22. (b) Steinberg, S.; Tor, Y.; Sabatani, E.; Rubinstein, I. J. Am. Chem. Soc. 1991, 113, 5176.
23. (c) Steinberg, S.; Rubinstein, I. Langmuir 1992, 8, 1183.
24. (a) Turyan, I.; Handler, D. Anal. Chem. 1994, 66, 58.
25. (b) Turyan, I.; Mandler, D. Anal. Chem. 1997, 69, 894.
26. Macdonald, J. R. Impedance Specrroscopy: Wiley: New York, 1987.
27. Gafni, Y.; Weizman, H.; Libman, J.; Shanzer, A.; Rubinstein, I. Chem. Eur. J. 1996, 2, 759.
28. Stora, T.; Hovius, R.; Dienes, Z.; Pachoud, M.; Vogel, H. Langmuir 1997, 13, 5211.
29. Henke, C.; Steinern, C.; Janshoff, A.; Steffan, G.; Luftmann, H.; Sieber, M.; Galla, H.-J. Anal. Chem. 1996, 68, 3158.
30. Ron, H.; Rubinstein, I. Langmuir 1994, 10, 4566.
31. (a) Equivalent Circuit version 4.55, 1996, Boukamp, B. A., University of Twente, Department Chemical Technology, Enschede, The Netherlands.
32. (b) Boukamp, B. A. Solid State Ionics 1986, 18-19, 136.
33. (c) Boukamp, B. A. Solid State Ionics 1986, 20, 31.
34. Yan, L.; Marzolin, C.; Terfort, A.; Whitesides, G. M. Langmuir 1997, 13, 6704.
35. Bruening, M. L.; Zhou, Y.; Aguilar, G.; Agee, R.; Bergbreiter, D. E.; Crooks, R. M. Langmuir 1997, 13, 770.
36. (a) Cheng, Q.; Brajter-Toth, A. Anal. Chem. 1992, 64, 1998.
37. (b) Takehara, K.; Takemura, H.; Ide, Y. Electrochim. Acta 1994, 39, 817.
38. (c) Cheng, Q.; Brajter-Toth, A. Anal. Chem. 1995, 67, 2767.
39. (d) Cheng, Q.; Brajter-Toth, A. Anal. Chem. 1996, 68, 4180.
40. Sato, Y.; Ye, S.; Haba, T.; Uosaki, K. Langmuir 1996, 12, 2726.
41. (a) Sabatani, E.; Rubinstein, I.; Maoz, R.; Sagiv, J. J. Electroanal, Chem. 1987, 219, 365.
42. (b) Sabatani, E.; Rubinstein, I. J. Phys. Chem. 1987, 91, 6663.
43. (c) Sabatani, E.; Cohen-Boulakia, J.; Bruening, M.; Rubinstein, I. Langmuir 1993, 9, 2974.
44. (d) Finklea, H. O.; Snider, D. A.; Fedyk, J.; Sabatani, E.; Gafni, Y.; Rubinstein, I. Langmuir 1993, 9, 3660.
45. (e) Nahir, T. M.; Bowden, E. F. Electrochim. Acta 1994, 36, 2347.
46. Sluyters-Rehbach, M.; Sluyters, J. H. In Electroanalytical Chemistry, Bard, A. J., Ed.; Marcel Dekker: New York, 1970; Vol. 4.
47. Adamson, A. W. Physical Chemistry of Surfaces: Wiley-Interscience: New York, 1990.
48. Terrettaz, S.; Vogel, H.; Grätzel, M. J. Electroanal. Chem. 1992, 326, 161.
49. CT at zero metal concentration.
50. (a) Izatt, R. M.; Pawlak, K.; Bradshaw, J. S.; Bruening, R. L. Chem. Rev. 1991, 91, 1721.
51. (b) Özkan, E.; Erk, Ç. Spectrosc. Lett. 1986, 19, 693.
52. (c) Yurdakoç, M. K.; Erk, Ç. Spectrosc. Left. 1987, 20, 983.
53. (a) Tamura, H.; Kimura, K.; Shono, T. Anal. Chem. 1982, 54, 1224.
54. (b) Moody, G. J.; Saad, B. B.; Thomas, J. D. R. Analyst 1989, 114, 15.
55. Rojas, M. T.; Königer, R.; Stoddart, J. F.; Kaifer, A. E. J. Am. Chem. Soc. 1995, 117, 336.