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Volumn 120-121, Issue , 1999, Pages 723-727

Different pulse techniques for stationary reactive sputtering with double ring magnetron

Author keywords

Double Ring Magnetron; Gradient layer; Magnetron sputter source; Pulse sputtering; Reactive sputtering

Indexed keywords

COATING; PULSED FLOW; SPUTTERING;

EID: 0033512263     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(99)00365-5     Document Type: Conference Paper
Times cited : (21)

References (8)
  • 1
    • 0029373096 scopus 로고
    • Advantageous possibilities, design aspects and technical use of Double Ring Magnetron sputter sources
    • Frach P., Goedicke K., Winkler T., Gottfried Chr., Walde H., Hentsch W. Advantageous possibilities, design aspects and technical use of Double Ring Magnetron sputter sources. Surf. Coat. Technol. 74/75:(1-3):1993;85-91.
    • (1993) Surf. Coat. Technol. , vol.7475 , Issue.13 , pp. 85-91
    • Frach, P.1    Goedicke, K.2    Winkler, T.3    Gottfried, Chr.4    Walde, H.5    Hentsch, W.6
  • 3
    • 0006671402 scopus 로고
    • High-rate reactive sputter deposition of aluminum oxide
    • Jones F., Logan J. High-rate reactive sputter deposition of aluminum oxide. J. Vac. Sci. Technol. A. 7:(3):1989;1240-1247.
    • (1989) J. Vac. Sci. Technol. a , vol.7 , Issue.3 , pp. 1240-1247
    • Jones, F.1    Logan, J.2
  • 4
    • 0012708406 scopus 로고
    • Structure and heat treatment characteristics of sputter-deposited alumina
    • Thornton J.A., Chin J. Structure and heat treatment characteristics of sputter-deposited alumina. Ceram. Bull. 56:(5):1977;504-512.
    • (1977) Ceram. Bull. , vol.56 , Issue.5 , pp. 504-512
    • Thornton, J.A.1    Chin, J.2
  • 5
    • 0031506420 scopus 로고    scopus 로고
    • Fabrication and characterization of graded refractive index silicon oxynitride thin films
    • Callard S., Gagnaire A., Joseph J. Fabrication and characterization of graded refractive index silicon oxynitride thin films. J. Vac. Sci. Technol. A. 15:(4):1997;2088-2094.
    • (1997) J. Vac. Sci. Technol. a , vol.15 , Issue.4 , pp. 2088-2094
    • Callard, S.1    Gagnaire, A.2    Joseph, J.3
  • 6
    • 0030190248 scopus 로고    scopus 로고
    • Characterization of silicon oxynitride thin films by infrared reflection absorption spectroscopy
    • Firon M., Bonnelle C., Mayeux A. Characterization of silicon oxynitride thin films by infrared reflection absorption spectroscopy. J. Vac. Sci. Technol. A. 14:(4):1996;2488-2492.
    • (1996) J. Vac. Sci. Technol. a , vol.14 , Issue.4 , pp. 2488-2492
    • Firon, M.1    Bonnelle, C.2    Mayeux, A.3
  • 7
    • 0037848197 scopus 로고    scopus 로고
    • Comparison of transparent conductive oxide thin films prepared by a.c. and d.c. reactive magnetron sputtering
    • Jäger S., Szyszka B., Szczyrbowski J., Bräuer G. Comparison of transparent conductive oxide thin films prepared by a.c. and d.c. reactive magnetron sputtering. Surf. Coat. Technol. 98:1998;1304-1314.
    • (1998) Surf. Coat. Technol. , vol.98 , pp. 1304-1314
    • Jäger, S.1    Szyszka, B.2    Szczyrbowski, J.3    Bräuer, G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.