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Volumn 26, Issue 12, 1999, Pages 2635-2647

Cone-beam computed tomography with a flat-panel imager: Effects of image lag

Author keywords

Amorphous silicon; Artifacts; Cone beam computed tomography; Flat panel imager; Image lag

Indexed keywords

AMORPHOUS SILICON; CHARGE TRAPPING; FILLING; PHANTOMS;

EID: 0033458079     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.598803     Document Type: Article
Times cited : (140)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.