Comparative surface studies at atomic resolution with ultrahigh vacuum variable-temperature atomic force and scanning tunneling microscopes

Microscopy and Microanalysis

Volumn 5, Issue 3, 1999, Pages 208-215

  Iwatsuki, Masashi ^a   Suzuki, Kazuyuki ^a   Kitamura, Shin Ich ^a   Kersker, Mike ^b  

^a JEOL LTD   (Japan)

^b JEOL USA INC   (United States)

Author keywords

Atomic force microscope; Contact potential difference; Frequency modulation detection; Noncontact; Scanning Kelvin probe microscope; Scanning tunneling microscope; Si(100); Si(111); Ultrahigh vacuum; Variable temperature

Indexed keywords

EID: 0033436155     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192769900015X     Document Type: Review

References (25)

1. Albrecht TR, Grütter P, Horne D, Rugar D (1991) Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity. J Appl Phys 69:668-673
2. Binnig G, Rohrer H, Gerber C, Weibel F (1982a) Surface studies by scanning tunneling microscopy. Phys Rev Lett 49:57-61
3. Binnig G, Rohrer H, Gerber C, Weibel E (1982b) Tunneling through a controllable vacuum gap. Appl Phys Lett 40:178-180
4. Binnig G, Rohrer H, Gerber C, Weibel E (1983) 7 × 7 reconstruction on Si(111) resolved in real space. Phys Rev Lett 50:120-123
5. Binnig G, Quate CF, Gerber C (1986) Atomic force microscope. Phys Rev Lett 56:930-933
6. CRC Handbook of Chemistry and Physics, 65th ed. (1985) Boca Raton, FL: CRC Press, E-70-E-77
7. Giessibl FJ (1995) Atomic resolution of the silicon (111)-(7 × 7) surface by atomic force microscopy. Science 267:68-71
8. Hamers RJ (1996) Scanned probe microscopies in chemistry. J Phys Chem 100:13103-13120
9. Hamers RJ, Köhler UK (1989) Determination of the local electronic structure of atomic-sized defects on Si(001) by tunneling spectroscopy. J Vac Sci Technol A 7:2854-2859
10. Iwatsuki M, Sato T, Tamamoto Y (1996) High-temperature STM for atomic processes on semiconductor surfaces. Appl Surf Sci 92:321-330
11. Kitamura S, Iwatsuki M (1995) Observation of 7 × 7 reconstructer structure on the silicon(111) surface using ultrahigh vacuum non-contact atomic force microscopy. Jpn J Appl Phys 34:L145-L148
12. Kitamura S, Iwatsuki M (1996a) Observation of silicon surfaces using ultrahigh-vacuum noncontact atomic force microscopy. Jpn J Appl Phys 35:L668-L671
13. Kitamura S, Iwatsuki M (1996b) Si surface observation by ultra-high-vacuum noncontact atomic force microscope. JEOL News 32E:42-49
14. Kitamura S, Iwatsuki M (1998) High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope. Appl Phys Lett 72:3154-3156
15. Kitamura S, Sato T, Iwatsuki M (1991) Observation of surface reconstruction on silicon above 800°C using the STM. Nature 351:215-217
16. Kuk Y, Silverman PJ (1989) Scanning tunneling microscope instrumentation. Rev Sci Instrum 60:165-180
17. Leibsle FM, Samsavar, Chiang TC (1988) Oxidation of Si(111)-(7 × 7) as studied by scanning tunneling microscopy. Phys Rev B 38:5780-5783
18. Lü J, Guggisberg M, Lüthi R, Kubon M, Scandella L, Gerber C, Meyer E, Güntherrodt HJ (1998) Surface potential studies using Kelvin force spectroscopy. Appl Phys A 66:S273-S275
19. Martin Y, Wickramasinghe (1987) Magnetic imaging by "force microscope" with 1000 Å resolution. Appl Phys Lett 50:1455-1457
20. Mate CM, McClelland GM, Erlandsson R, Chiang S (1987) Atomic-scale friction of a tungsten tip on a graphite surface. Phys Rev Lett 59:1942-1945
21. Pelz JP, Koch RH (1990) Successive oxidation stages and annealing behavior of the Si(111) 7 × 7 surface observed with scanning tunneling microscopy and scanning tunneling spectroscopy. J Vac Sci Technol B 9:775-778
22. Pohl DW, Denk W, Lanz M (1984) Optical stethoscopy: image recording with resolution λ/20. Appl Phys Lett 44:651-653
23. Snetivy D, Vancso J (1994) Atomic force microscopy of polymer crystal: 7. Chain packing, disorder and imaging of methyl groups in oriented isotactic polypropylene. Polymer 35:461-467
24. Tokumoto H, Miki K, Murakami H, Bando H, Ono M, Kajimura K (1990) Real-time observation of oxygen and hydrogen adsorption on silicon surfaces by scanning tunneling microscopy. J Vac Sci Technol A 8:255-258
25. Ueyama H, Ohta M, Sugawara Y, Morita S (1995) Atomically resolved InP(110) surface observed with noncontact ultrahigh vacuum atomic force microscope. Jpn J Appl Phys 34:L1086-L1088