Characterization of the absolute crystal polarity across twin boundaries in gallium phosphide using convergent-beam electron diffraction

Microscopy and Microanalysis

Volumn 5, Issue 3, 1999, Pages 173-186

  Cohen, Dov ^a   McKernan, Stuart ^a   Carter, C Barry ^a  

^a University of Minnesota   (United States)

Author keywords

Compound semiconductors; Convergent beam electron diffraction; Crystal polarity; Diffraction contrast; Grain boundaries; Interface structure; Twin boundaries

Indexed keywords

EID: 0033422842     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927699000124     Document Type: Article

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