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Volumn 25, Issue 9, 1996, Pages 1545-1550

Structural characterization of bulk GaN crystals grown under high hydrostatic pressure

Author keywords

Bulk GaN; Crystal polarity; Excess Ga; Microstructure; Planar defects; Surface roughness

Indexed keywords


EID: 0000437306     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02655397     Document Type: Article
Times cited : (83)

References (22)
  • 22
    • 0004291219 scopus 로고
    • Intl. Series on Materials Science and Technology, Oxford, New York, Beijing, Frankfurt, Sao Paulo, Sydney, Tokyo, Toronto: Pergamon Press
    • D. Hull and D. J. Bacon, Introduction to Dislocations, 3rd Ed., Intl. Series on Materials Science and Technology, (Oxford, New York, Beijing, Frankfurt, Sao Paulo, Sydney, Tokyo, Toronto: Pergamon Press, 1984), p. 112.
    • (1984) Introduction to Dislocations, 3rd Ed. , pp. 112
    • Hull, D.1    Bacon, D.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.