Characterization of APB's in GaP

Materials Research Society Symposium - Proceedings

Volumn 442, Issue , 1997, Pages 503-508

  Cohen, Dov ^a   Carter, Barry C ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL GROWTH; CRYSTAL ORIENTATION; GRAIN BOUNDARIES; INTERFACES (MATERIALS); LATTICE CONSTANTS; SEMICONDUCTING SILICON; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

ANTIPHASE BOUNDARIES; GALLIUM PHOSPHIDE; STRUCTURAL PROPERTIES;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0030674892     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)