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Microscopy and Microanalysis
Volumn 5, Issue 4, 1999, Pages 290-295
Analysis of probe-sample interaction in near-field optical image of dielectric structures
Author keywords

Microscopy; Near field optics; Optical imaging; Photon scanning tunneling microscopy; Scanning near field optical microscopy
Indexed keywords

EID: 0033414683     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927699990323     Document Type: Article
Times cited : (3)
References (15)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.