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Volumn 43, Issue 10, 1996, Pages 2119-2127
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A macroscopic approach to near-field optical microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
LIGHT POLARIZATION;
MULTILAYERS;
NONDESTRUCTIVE EXAMINATION;
RAYLEIGH SCATTERING;
SCANNING TUNNELING MICROSCOPY;
MACROSCOPIC APPROACH;
NEAR FIELD OPTICAL MICROSCOPY;
RAYLEIGH METHOD;
OPTICAL MICROSCOPY;
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EID: 0030263933
PISSN: 09500340
EISSN: 13623044
Source Type: Journal
DOI: 10.1080/09500349608232874 Document Type: Article |
Times cited : (12)
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References (13)
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