Optical near field scattered by surface defects: Two-dimensional numerical analysis

Optical Review

Volumn 4, Issue 1 PART B, 1997, Pages 228-231

  Wang, Shu ^a   Xiao, Mufei ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Microscopy; Near field optics; PSTM; SNOM; Theoretical modeling

Indexed keywords

EID: 0031483112     PISSN: 13406000     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02931686     Document Type: Article

References (10)

1. For example, see Near Field Optics, eds. D.W. Pohl and D.W. Courjon (Kluwer, Dordrecht, The Netherlands, 1993)
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