Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1608-1615

  Titus, J L ^a  

^a NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENHANCED LOW DOSE RATE SENSITIVITY; GROUND BASED TESTS;

BIPOLAR TRANSISTORS; DOSIMETERS; GAMMA RAYS; IRRADIATION; LINEAR INTEGRATED CIRCUITS; RADIATION HARDENING; SPACE APPLICATIONS; TEMPERATURE;

RADIATION EFFECTS;

EID: 0033350984     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819128     Document Type: Article

References (11)

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