Defect level prediction using multi-model fault coverage

Proceedings of the Asian Test Symposium

Volumn , Issue , 1999, Pages 301-306

  Lu, Shyue Kung ^a   Lee, Tsung Ying ^a   Wu, Cheng Wen ^a  

^a FU JEN CATHOLIC UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

MULTIMODEL FAULT COVERAGE (MFC);

CRYSTAL DEFECTS; INTEGRATED CIRCUIT MANUFACTURE;

VLSI CIRCUITS;

EID: 0033330393     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (21)

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