Quality and single-stuck faults

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 597-

  McCluskey, E J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT LOCATION; INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; PRODUCTION CONTROL; QUALITY CONTROL;

CHIP QUALITY REQUIREMENTS; COST REDUCTION REQUIREMENTS; SINGLE STUCK FAULTS; TEST PATTERN GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0027799155     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)