Analyses on the measurement of leakage currents in cdznte radiation detectors

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 4, 1999, Pages 2289-2296

  Mescher, M J ^a   Hoburg, J F ^a   Schlesinger, T E ^a   James, R B ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Cadmium zinc telluride; Electrostatic field modeling; Leakage current; Surface passivation

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; LEAKAGE CURRENTS; MATHEMATICAL MODELS; PASSIVATION; SEMICONDUCTING CADMIUM COMPOUNDS; SUBSTRATES;

BULK RESISTIVITY; CADMIUM ZINC TELLURIDE; HIGH RESISTIVITY SEMICONDUCTOR MATERIALS; SURFACE SHEET RESISTANCE;

RADIATION DETECTORS;

EID: 0033324910     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819319     Document Type: Article

References (19)

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