Single-word Multiple-bit Upsets in Static Random Access Devices

IEEE Transactions on Nuclear Science

Volumn 40, Issue 6, 1993, Pages 1941-1946

  Koga, R ^a   Pinkerton, S D ^a   Lie, T J ^a   Crawford, K B ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONS; PRODUCT DESIGN; PROTONS; RADIATION EFFECTS; SPACE APPLICATIONS; TESTING;

ENERGETIC PARTICLES; INCIDENCE ANGLES; SINGLE WORD MULTIPLE BIT UPSETS; SPACE BORNE ELECTRONICS SYSTEM; SPACE RADIATION ENVIRONMENT; STATIC RANDOM ACCESS MEMORY;

RANDOM ACCESS STORAGE;

EID: 0027841919     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273460     Document Type: Article

References (9)

1. Blake, J.B. and R. Mandel, “On-orbit Observation of Single Event Upset in Harris HM-6508 1K RAMs,” IEEE Transactions on Nuclear Science, NS-33, 1616–1619, 1986.
2. Criswell, T.L., P.R. Measel, and K.L. Walin, “Single Event Upset Testing with Relativistic Heavy Ions,” IEEE Transactions on Nuclear Science, NS-31, 1559–1561, 1984.
3. Criswell, T.L., D.L. Oberg, J.L. Wert, P.R. Measel, and W.E. Wilson, “Measurement of SEU Thresholds and Cross Sections at Fixed Incident Angles,” IEEE Transactions on Nuclear Science, NS-34, 1316–1321, 1987.
4. Koga, R., K.B. Crawford, P.B. Grant, W.A. Kolasinski, D.L. Leung, T.J. Lie, D.C. Mayer, S.D. Pinkerton, and T.K. Tsubota, “Single Ion Induced Multiple-bit Upset in IDT 256K SRAMs,” Proceedings of the Second European Conference on Radiation and Its Effects on Devices and Systems (RADECS ‘93), submitted, 1993.
5. Smith, E.C., and M. Shoga, “Double Upsets from Glancing Collisions: A Simple Model Verified with Flight Data,” IEEE Transactions on Nuclear Science, 39, 1859–1864, 1992.
6. Martin, R.C., N.M. Ghoniem, Y. Song, J.S. Cable, “The Size Effect of Ion Charge Tracks on Single Event Multiple-bit Upset,” IEEE Transactions on Nuclear Science, NS-34, 1305–1309, 1987.
7. Koga, R., W.R. Crain, K.B. Crawford, D.D. Lau, S.D. Pinkerton, B.K. Yi, and R. Chitty, “On the Suitability of Non-hardened High Density SRAM's for Space Applications,” IEEE Transactions on Nuclear Science, 38, 1507–1513, 1991.
8. McDonald, P.T., W.J. Stapor, A.B. Campbell, and L.W. Massengill, “Non-Random Single Event Upset Trends,” IEEE Transactions on Nuclear Science, 36, 2324–2329, 1989.
9. Dufour, C., P. Garnier, T. Carrière, J. Beaucour, R. Ecoffet, and M. Labrunée, “Heavy Ion Induced Single Hard Errors on Submicronic Memories,” IEEE Transactions on Nuclear Science, 39, 1693–1697, 1992.