메뉴 건너뛰기




Volumn 35, Issue SUPPL. 4, 1999, Pages

Shallow dopant implant profiles prediction in silicon using efficient molecular dynamics computer schemes

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0033266939     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (22)
  • 22
    • 0008504219 scopus 로고    scopus 로고
    • Chap. 5 Doctor of Philosophy, The Univ. of Texas at Austin
    • 2, and Boron Implants, Doctor of Philosophy, The Univ. of Texas at Austin (1997).
    • (1997) 2, and Boron Implants
    • Tian, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.