Optical characterization of cubic AlGaN epilayers by cathodoluminescence and spectroscopic ellipsometry

Physica Status Solidi (B) Basic Research

Volumn 216, Issue 1, 1999, Pages 211-214

  Okumura, H ^a   Koizumi, T ^b   Ishida, Y ^a   Yaguchi, H ^c   Yoshida, S ^c  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b SHIBAURA INSTITUTE OF TECHNOLOGY   (Japan)

^c SAITAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033229242     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199911)216:1<211::AID-PSSB211>3.0.CO;2-J     Document Type: Article

References (10)

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