Domain structure of poled ferroelectric (111) PZT (PbZr 0.25Ti 0.75O 3) films

Materials Research Society Symposium - Proceedings

Volumn 541, Issue , 1999, Pages 449-456

  Zybill, C E ^a   Boubekeur, H ^a   Radojkovic, P ^a   Schwartzkopff, M ^a   Hartmann, E ^a   Koch, F ^a   Groos, G ^b   Rezek, B ^b   Bruchhaus, R ^c   Wersing, W ^c  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

^c SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM NICKEL ALLOYS; LEAD ZIRCONIUM TITANATE; NEGATIVE CORRUGATION EFFECT; SMALL ANGLE X RAY SCATTERING; STRAIN DISTRIBUTION;

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CRYSTAL SYMMETRY; CRYSTALLOGRAPHY; METALLIZING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING LEAD COMPOUNDS; STRESS CONCENTRATION; THICKNESS MEASUREMENT; X RAY SCATTERING;

FERROELECTRIC MATERIALS;

EID: 0032592304     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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