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Microelectronic Engineering

Volumn 48, Issue 1, 1999, Pages 75-78

Effect of local surface structure on electronic properties of hydrogenated silicon surfaces

(7) Dittrich, Th a Timoshenko, V Yu a,c Schwartzkopff, M a Hartmann, E a Rappich, J b Kashkarov, P K c Koch, F a

a TECHNICAL UNIVERSITY OF MUNICH (Germany)

b HAHN MEITNER INSTITUT (Germany)

c MOSCOW STATE UNIVERSITY (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; HYDROGENATION; MORPHOLOGY; PHOTOLUMINESCENCE; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS;

PHOTOVOLTAGE;

SEMICONDUCTING SILICON;

EID: 0033190146 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/S0167-9317(99)00342-1 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.