Efficient beam-selection criteria in quantitative convergent beam electron diffraction

Ultramicroscopy

Volumn 66, Issue 1-2, 1996, Pages 89-99

  Birkeland, C ^a   Holmestad, R ^a   Marthinsen, K ^b   Hoier R ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b SINTEF   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; PARTICLE BEAM DYNAMICS; PERTURBATION TECHNIQUES;

BETHE PERTURBATION TECHNIQUE; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED);

ELECTRON BEAMS;

ARTICLE; ELECTRON BEAM; ELECTRON DIFFRACTION;

EID: 0030292151     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00082-4     Document Type: Article

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