Quantitative convergent beam electron diffraction

Materials Transactions, JIM

Volumn 39, Issue 9, 1998, Pages 938-946

  Zuo, J M ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Convergent beam electron diffraction; Electron diffraction; Lattice parameters; Structure refinement

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; CORRELATION METHODS; IMAGE ENHANCEMENT; LATTICE CONSTANTS; SILICON;

CONVERGENT-BEAM ELECTRON DIFFRACTION (CBED);

ELECTRON DIFFRACTION;

EID: 0032158169     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.39.938     Document Type: Review

References (45)

1. J. M. Zuo: Microscopy and Microanalysis vol 3, suppl. 2, proceedings, San Francisco Press (1997), p. 1151.
2. K. W. Andrews, D. J. Dyson and S. R. Keown: Interpretation of electron diffraction patterns, Plenum, New York, (1967).
3. R. Hoier: Acta Cryst. A, 25 (1969), 516.
4. R. Jones, G. M. Rackham and J. M. Steeds: Proc. R. Soc. Lond., A 354 (1977), 197.
5. Y. P. Lin, D. M. Bird and R. Vincent: Ultramicroscopy, 27 (1989), 233.
6. J. M. Zuo: Ultramicroscopy, 41 (1992), 211.
7. Y. Tomokiyo, S. Matsumura, T. Okuyama, T. Yasunaga, N. Kuwano and K. Oki: Ultramicr., 54 (1993), 276.
8. S. K. Streiffer, S. Bader, C. Deininger, J. Mayer and M. Rühle: Mat. Res. Soc. Symp. Proc., 343 (1994), 615.
9. J. C. H. Spence and J. M. Zuo: Electron microdiffraction, Plenum, New York, (1992).
10. J. M. Zuo, M. Kim and R. Holmestad: J. of Electron Micros. (1998), in print.
11. J. M. Zuo, J. C. H. Spence and M. O'Keeffe: Phys. Rev. Lett., 61 (1988), 353.
12. J. M. Zuo, J. C. H. Spence and R. Hoier: Phys. Rev. Lett., 62 (1989), 547.
13. J. M. Zuo and J. C. H. Spence: Ultramicroscopy, 35 (1991), 185;
14. J. M. Zuo: Acta Crystallogr. A, 49 (1993), 429.
15. M. Saunders and D. M. Bird: Ultramicroscopy, 60 (1995), 311.
16. W. Nuchter, A. L. Weickenmeier and J. Mayer: Inst. Phys. Conf. Series, 147 (1995), 129.
17. C. R. Birkeland, R. Holmestad, K. Marthinsen and R. Hoier: Ultramicros., 66 (1997), 89.
18. D. B. Williams and C. B. Carter: Transmission electron microscopy, Plenum, New York, (1996).
19. P. Rez: Acta Cryst. A, 34 (1978), 48.
20. H. Yoshioka: J. Phys. Soc. Jap., 12 (1957), 618.
21. D. Bird and Q. A. King: Acta Cryst., A 46 (1990), 202.
22. A. L. Weickenmeier and H. Kohl: Acta Cryst., A 47 (1991), 590.
23. A. L. Weickenmeier and H. Kohl: Acta Cryst. Submitted, (1997).
24. L. M. Peng: Acta Cryst. A, Submitted, (1997).
25. G. R. Anstis: Acta Cryst. A, 52 (1996), 3.
26. A. J. F. Metherell: Electron Microscopy and Materials Science, Ed. by U. Valdre and R. Reudl: Commission of european Communities, Director General, Scientific and Technical Information, Luxembourg, (1975).
27. J. M. Zuo and A. L. Weickenmeier: Ultramicr., 57 (1995), 375.
28. C. R. Birkeland, R. Holmestad, K. Marthinsen and R. Høier: Ultramicr., 66 (1996), 89.
29. References and descriptions about EISPACK and LAPACK can be found at http://www.netlib.org/ or ftp.netlib.org.
30. L. M. Peng and J. M. Zuo: Ultramicros., 57 (1995), 1.
31. M. A. Gribelyuk and M. Ruhle: Proc. 51st of MSA, (1993), p. 674.
32. H. Rose and D. Krahl: Electron optics of imaging energy filters, in Energy Filtering Transmission Electron Microscopy, Ed. by L. Reimer, Springer, Berlin, (1995), p. 43-149.
33. J. M. Zuo: Ultramicr., 66 (1996), 21.
34. J. M. Zuo, M. R. McCartney and J. C. H. Spence: Ultramicr., 66 (1996), 35.
35. G. Ren, J. M. Zuo and L. M. Peng: Micron in press, (1997).
36. D. L. Snyder, A. Hammond and R. L. White: J. Opt. Soc. Am A, 10 (1993), 1014.
37. J. M. Zuo, P. Blaha and K. Schwarz: J. Phys. Condensed. Matter., 9 (1997), 7541.
38. Y. Zhu, J. M. Zuo, A. R. Moodenbaugh and M. Suenaga: Phil. Mag., A 70 (1994), 969.
39. K. Tsuda and M. Tanaka: Acta Cryst., A 51 (1995), 7.
40. K. Gjonnes, N. Boe and J. Tafto: Ultramicros., 48 (1993), 37.
41. th Asia-Pacific Conf. On Electron Microscopy, Ed. by D. Barber et al., Hong Kong, Chinetek Promotion, (1996), p. 115.
42. R. Holmestad, J. P. Morniroli, J. M. Zuo, J. C. H. Spence and A. Avilov: Inst. of Phys. Conf. Series, 153 (1997), 137.
43. R. Holmestad, J. M. Zuo, J. C. H. Spence, R. Høier and Z. Horita: Phil. Mag., A 72 (1995), 579.
44. J. M. Zuo, M. O'Keeffe, P. Rez and J. C. H. Spence: Phys. Rev. Lett., 78 (1997), 4777.
45. S. Kujawa, D. Krahl, H. Niedrig and E. Zeitler: Optik, 86 (1990), 39.