Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Microscopy Microanalysis Microstructures

Volumn 8, Issue 3, 1997, Pages 187-202

  Morniroli, Jean Paul ^a   Cordier, Patrick ^a   Van Cappellen, Éric ^b   Zuo, Jin Min ^c   Spence, John ^c  

^a UNIV LILLE   (France)

^b Philips Electron Optics BV Bldg AAE   (United States)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345522720     PISSN: 11542799     EISSN: None     Source Type: Journal    
DOI: 10.1051/mmm:1997114     Document Type: Article

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