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Volumn 46, Issue 2, 1999, Pages 413-419

A study on maximum turn-off current of a high-power GTO

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; EQUIVALENT CIRCUITS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; VOLTAGE MEASUREMENT;

EID: 0033079565     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.740909     Document Type: Article
Times cited : (15)

References (10)
  • 2
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    • "A study on GTO turn-off failure mechanism," in
    • H. Ohashi and A. Nakagawa, "A study on GTO turn-off failure mechanism," in Proc. IEDM'91, pp. 414-417.
    • Proc. IEDM'91 , pp. 414-417
    • Ohashi, H.1    Nakagawa, A.2
  • 3
    • 33947641377 scopus 로고    scopus 로고
    • "ID-Simulations and experiments on avalanche injection in GTO's," in
    • M. Stoisiek, G. Wachutka, and D. Theis, "ID-Simulations and experiments on avalanche injection in GTO's," in Proc. ISPSD'88, pp. 48-55.
    • Proc. ISPSD'88 , pp. 48-55
    • Stoisiek, M.1    Wachutka, G.2    Theis, D.3
  • 4
    • 0025485583 scopus 로고
    • "A new buried-gate GTO structure having a large safe operating area,"
    • Y. Satou, T. Yatsuo, and S. Sakurada, "A new buried-gate GTO structure having a large safe operating area," IEEE Trans. Electron Devices, vol. 37, pp. 2034-2038, Sept. 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 2034-2038
    • Satou, Y.1    Yatsuo, T.2    Sakurada, S.3
  • 5
    • 85015132810 scopus 로고    scopus 로고
    • "4.5 kV GTO turn-off failure analysis under an inductive load including snubber, gate circuit and various parasitics," in
    • I. Ohmura and A. Nakagawa, "4.5 kV GTO turn-off failure analysis under an inductive load including snubber, gate circuit and various parasitics," in Proc. ISPSD'92, pp. 112-117.
    • Proc. ISPSD'92 , pp. 112-117
    • Ohmura, I.1    Nakagawa, A.2
  • 6
    • 0026954947 scopus 로고
    • "A study of turn-off limitations and failure mechanism of GTO thyristor by means of 2D time resolved optical measurement,"
    • H. Büchner, M. Bakowski, M. Rosling, E. Nordlander, J. Vobecky, M. Lundquist, and S. Berg, "A study of turn-off limitations and failure mechanism of GTO thyristor by means of 2D time resolved optical measurement," Solid-State Electron., vol. 35, pp. 1683-1695, 1992.
    • (1992) Solid-State Electron. , vol.35 , pp. 1683-1695
    • Büchner, H.1    Bakowski, M.2    Rosling, M.3    Nordlander, E.4    Vobecky, J.5    Lundquist, M.6    Berg, S.7
  • 7
    • 0029190918 scopus 로고    scopus 로고
    • "The two basic failure modes in the GTO modes in the GTO modeling and experiment," in
    • M. Bakowski and U. Gustafsson, "The two basic failure modes in the GTO modes in the GTO modeling and experiment," in Proc. ISPSD'95, pp. 354-368.
    • Proc. ISPSD'95 , pp. 354-368
    • Bakowski, M.1    Gustafsson, U.2
  • 8
    • 0344078362 scopus 로고
    • "Performance limitations of a GTO with near-perfect technology,"
    • A. A. Jaecklin, "Performance limitations of a GTO with near-perfect technology," IEEE Trans. Electron Devices, vol. 39, pp. 1507-1513, June 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 1507-1513
    • Jaecklin, A.A.1
  • 9
    • 0024682925 scopus 로고
    • "Design considerations for large-current GTO's,"
    • T. Yatsuo, S. Kimura, and Y. Satou, "Design considerations for large-current GTO's," IEEE Trans. Electron Devices, vol. 36, pp. 1196-1202, June 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 1196-1202
    • Yatsuo, T.1    Kimura, S.2    Satou, Y.3
  • 10
    • 0029178205 scopus 로고    scopus 로고
    • "Analysis of diode recovery phenomena using transient analysis method for semiconductor devices coupled with external circuit," in
    • A. Mishima, S. Kimura, M. Mori, and H. Kozaka, "Analysis of diode recovery phenomena using transient analysis method for semiconductor devices coupled with external circuit," in P roc. ISPSD'95, pp. 396-399.
    • P Roc. ISPSD'95 , pp. 396-399
    • Mishima, A.1    Kimura, S.2    Mori, M.3    Kozaka, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.