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Volumn , Issue , 1981, Pages 414-417
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STUDY ON GTO TURN-OFF FAILURE MECHANISM.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ANODE CURRENT DENSITY;
ANODE VOLTAGE;
DEVICE DESIGN PARAMETERS;
EXACT ONE-DIMENSIONAL MODEL;
EXTERNAL CIRCUIT CONDITIONS;
FAILURE MECHANISM;
GATE TURN-OFF THYRISTOR;
INFRARED MICROSCOPE EXAMINATION;
CURRENT CROWDING;
THYRISTORS;
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EID: 0019676126
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (28)
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References (0)
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