Two basic failure modes in the GTO - modelling and experiment

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1995, Pages 354-368

  Bakowski, M ^a   Gustafsson, U ^a  

^a ACREO AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; ELECTRIC CURRENTS; FAILURE ANALYSIS; IONIZATION OF SOLIDS; NUMERICAL ANALYSIS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR JUNCTIONS; STRESSES;

IMPACT IONIZATION; LOCAL DYNAMIC AVALANCHE MODE; SELF HEATING; THERMAL RUN AWAY MODE;

THYRISTORS;

EID: 0029190918     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)