4.5 kV GTO turn-off failure analysis under an inductive load including snubber, gate circuit and various parasitics

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

Volumn 1992-May, Issue , 1992, Pages 112-117

  Omura, Ichiro ^a   Nakagawa, Akio ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE (MECHANICAL); IMPACT IONIZATION; NUMERICAL METHODS; OUTAGES; TIMING CIRCUITS;

EXTERNAL CIRCUITS; FAILURE PROCESS; GATE CIRCUIT; GATE TURN-OFF THYRISTORS; INDUCTIVE LOADS; NUMERICAL CONVERGENCE; PARASITICS; TURN OFFS;

SEMICONDUCTOR DEVICES;

EID: 85015132810     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.1992.991246     Document Type: Conference Paper

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