Detection of Boron Segregation to Grain Boundaries in Silicon Carbide by Spatially Resolved Electron Energy-Loss Spectroscopy

Journal of the American Ceramic Society

Volumn 82, Issue 2, 1999, Pages 469-472

  Gu, Hui ^a   Shinoda, Yutaka ^a   Wakai, Fumihiro ^b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CARBON; CHEMICAL BONDS; DENSIFICATION; DIFFUSION IN SOLIDS; DOPING (ADDITIVES); ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN BOUNDARIES; HOT PRESSING;

BORON SEGREGATION;

SILICON CARBIDE;

EID: 0033079212     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.1999.tb20089.x     Document Type: Article

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