Characterization of materials and devices by near-field scanning optical microscopy

Materials Research Society Symposium - Proceedings

Volumn 406, Issue , 1996, Pages 171-182

  Goldberg, B B ^a   Ghaemi, H F ^a   Unlu, M S ^a   Herzog, W D ^a  

^a BOSTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; EMISSION SPECTROSCOPY; HETEROJUNCTIONS; OPTICAL FIBERS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PHOTONS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR LASERS;

GALLIUM INDIUM PHOSPHIDE; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PEAK ENERGY; PHOTOCURRENT SPECTROSCOPY;

OPTICAL MICROSCOPY;

EID: 0029779496     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (28)