I/f noise in ion sensitive field effect transistors from subthreshold to saturation

IEEE Transactions on Electron Devices

Volumn 46, Issue 1, 1999, Pages 259-261

  Jakobson, C G ^a   Nemirovsky, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FREQUENCY MEASUREMENT; ELECTRIC POTENTIAL; PH; SPURIOUS SIGNAL NOISE;

ION SENSITIVE FIELD EFFECT TRANSISTORS (ISFET);

FIELD EFFECT TRANSISTORS;

EID: 0032715713     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.737468     Document Type: Article

References (14)

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