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Volumn BME-17, Issue 1, 1970, Pages 70-71

Short Communications: Development of an Ion-Sensitive Solid-State Device for Neurophysiological Measurements

Author keywords

[No Author keywords available]

Indexed keywords

ION;

EID: 0014698380     PISSN: 00189294     EISSN: 15582531     Source Type: Journal    
DOI: 10.1109/TBME.1970.4502688     Document Type: Article
Times cited : (1792)

References (5)
  • 1
    • 0009703767 scopus 로고
    • Design theory of a surface field-effect transistor
    • H. K. J. Ihantola and J. L. Moll, “Design theory of a surface field-effect transistor,” Solid-State Electronics, vol. 7, pp. 423-430, 1964.
    • (1964) Solid-State Electronics , vol.7 , pp. 423-430
    • Ihantola, H.K.J.1    Moll, J.L.2
  • 2
    • 20344388361 scopus 로고
    • Characteristics of the surface state charge (Gas) of thermally oxidized silicon
    • March
    • B. E. Deal. M. Sklar, A. S. Grove, and E. H. Snow, “Characteristics of the surface state charge (Gas) of thermally oxidized silicon,” J. Elecirochem. Soc, vol. 114, pp. 266-274, March 1967.
    • (1967) J. Elecirochem. Soc , vol.114 , pp. 266-274
    • Deal, B.E.1    Sklar, M.2    Grove, A.S.3    Snow, E.H.4
  • 3
    • 73049154846 scopus 로고
    • Cation selective glass electrodes and their mode of operation
    • G. Eisenman, “Cation selective glass electrodes and their mode of operation,” Biophys. J., vol. 2, pp. 259-323, 1962.
    • (1962) Biophys. J. , vol.2 , pp. 259-323
    • Eisenman, G.1
  • 4
    • 0011730583 scopus 로고
    • New amplification method for depth recording
    • April
    • P. Bergveld, “New amplification method for depth recording,” IEEE Trans. Bio-Medical Engineering, vol. BME-15, pp. 102-105, April 1968.
    • (1968) IEEE Trans. Bio-Medical Engineering , vol.BME-15 , pp. 102-105
    • Bergveld, P.1
  • 5
    • 84937995682 scopus 로고
    • The influence of substrate bias upon the ac characteristics of MOS transistors
    • January
    • “The influence of substrate bias upon the ac characteristics of MOS transistors,” Proc. IEEE (Letters), vol. 57, pp. 72-73, January 1969.
    • (1969) Proc. IEEE (Letters) , vol.57 , pp. 72-73


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.