Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ ƒ) noise

Advances in Physics

Volumn 38, Issue 4, 1989, Pages 367-468

  Kirton, M J ^a   Uren, M J ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012278046     PISSN: 00018732     EISSN: 14606976     Source Type: Journal    
DOI: 10.1080/00018738900101122     Document Type: Article

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