In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays

Applied Physics Letters

Volumn 73, Issue 6, 1998, Pages 806-808

  Darowski, N ^a   Pietsch, U ^a   Zhuang, Y ^b   Zerlauth, S ^b   Bauer, G ^b   Lubbert D ^c   Baumbach, T ^c  

^a UNIVERSITY OF POTSDAM   (Germany)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^c FRAUNHOFER INSTITUTE FOR NON DESTRUCTIVE TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010113751     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122008     Document Type: Article

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