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Volumn 47, Issue 5, 1999, Pages 1497-1511

Ion implantation-induced nanoscale particle formation in Al2O3 and SiO2 via reduction

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ION IMPLANTATION; PARTICLE SIZE ANALYSIS; SILICA; SINGLE CRYSTALS;

EID: 0032679567     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00028-2     Document Type: Article
Times cited : (12)

References (49)
  • 21
    • 36149016289 scopus 로고
    • Doyle W.T. Phys. Rev. 111(4):1958;1067.
    • (1958) Phys. Rev. , vol.111 , Issue.4 , pp. 1067
    • Doyle, W.T.1
  • 22
    • 85031625422 scopus 로고    scopus 로고
    • PROFILE Ion Implantation Code, Implant Sciences Corp., 35 Cherry Hill Drive, Danvers, MA 09123, U.S.A
    • PROFILE Ion Implantation Code, Implant Sciences Corp., 35 Cherry Hill Drive, Danvers, MA 09123, U.S.A


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.