Formation and chemical - Physical characterization of metallic nanoclusters in ion-implanted silica

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 116, Issue 1-4, 1996, Pages 102-108

  Battaglin, G ^a  

^a INFM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHROMIUM; COLLOIDS; COPPER; NANOSTRUCTURED MATERIALS; OPTICAL KERR EFFECT; PLATINUM METALS; SEMICONDUCTING GLASS; SILICA; TITANIUM; TUNGSTEN; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL INTERACTIONS; CHEMICAL REACTIVITY; METALLIC NANOCLUSTERS; OPTICAL KERR SUSCEPTIBILITY;

ION IMPLANTATION;

EID: 0030217282     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00017-1     Document Type: Article

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