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Volumn 19, Issue 7, 1998, Pages 222-224

Low-frequency noise in AlGaN/GaN heterostructure field effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; FREQUENCY RESPONSE; HETEROJUNCTIONS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SPURIOUS SIGNAL NOISE;

EID: 0032121634     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.701423     Document Type: Article
Times cited : (56)

References (12)
  • 1
    • 0001561898 scopus 로고    scopus 로고
    • Very high breakdown voltage and large transconductance realized on GaN heterojunction field effect transistors
    • Y.-F. Wu, B. P. Keller, S. Keller, D. Kapolnek, P. Kozodoy, S. P. Denbaars, and U. K. Mishra, "Very high breakdown voltage and large transconductance realized on GaN heterojunction field effect transistors," Appl. Phys. Lett., vol. 69, no. 10, pp. 1438-1440, 1996.
    • (1996) Appl. Phys. Lett. , vol.69 , Issue.10 , pp. 1438-1440
    • Wu, Y.-F.1    Keller, B.P.2    Keller, S.3    Kapolnek, D.4    Kozodoy, P.5    Denbaars, S.P.6    Mishra, U.K.7
  • 3
    • 84886448169 scopus 로고    scopus 로고
    • High performance 0.25 μm gate-length doped-channel AlGaN/GaN heterostructure field effect transistors grown on p-type SiC substrates
    • A. T. Ping, Q. Chen, J. W. Yang, M. A. Khan, and I. Adesida, "High performance 0.25 μm gate-length doped-channel AlGaN/GaN heterostructure field effect transistors grown on p-type SiC substrates," in IEDM Tech. Dig., 1997, pp. 561-564.
    • (1997) IEDM Tech. Dig. , pp. 561-564
    • Ping, A.T.1    Chen, Q.2    Yang, J.W.3    Khan, M.A.4    Adesida, I.5
  • 5
    • 0021204462 scopus 로고
    • Parasitic MESFET in (Al,Ga)As/GaAs modulation doped FET's and MODFET characterization
    • Jan.
    • K. Lee, M. S. Shur, T. J. Drummond, and H. Morkoc, "Parasitic MESFET in (Al,Ga)As/GaAs modulation doped FET's and MODFET characterization," IEEE Trans. Electron Devices, vol. ED-31, pp. 29-35, Jan. 1984.
    • (1984) IEEE Trans. Electron Devices , vol.ED-31 , pp. 29-35
    • Lee, K.1    Shur, M.S.2    Drummond, T.J.3    Morkoc, H.4
  • 7
    • 0015142053 scopus 로고
    • Characterization of low 1/f noise in MOS transistors
    • Oct.
    • F. M. Klaassen, "Characterization of low 1/f noise in MOS transistors," IEEE Trans. Electron Devices, vol. ED-18, pp. 887-891, Oct. 1971.
    • (1971) IEEE Trans. Electron Devices , vol.ED-18 , pp. 887-891
    • Klaassen, F.M.1
  • 8
    • 49349139058 scopus 로고
    • 1/f noise
    • F. N. Hooge, "1/f noise," Physica B, vol. 83, pp. 14-23, 1976.
    • (1976) Physica B , vol.83 , pp. 14-23
    • Hooge, F.N.1
  • 9
    • 0020750626 scopus 로고
    • 1/f noise in HEMT-type GaAs FET's at low drain bias
    • A. van der Ziel, "1/f noise in HEMT-type GaAs FET's at low drain bias," Solid-State Electron., vol. 26, no. 5, pp. 385-386, 1983.
    • (1983) Solid-State Electron. , vol.26 , Issue.5 , pp. 385-386
    • Van Der Ziel, A.1
  • 12
    • 0019009162 scopus 로고
    • 1/f noise model for MOST's biased in nonohmic region
    • L. K. J. Vandamme and H. M. M. de Werd, "1/f noise model for MOST's biased in nonohmic region," Solid State Electron, vol. 23, pp. 325-329, 1980.
    • (1980) Solid State Electron , vol.23 , pp. 325-329
    • Vandamme, L.K.J.1    De Werd, H.M.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.