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Volumn 38, Issue 3 A, 1999, Pages 1339-1342
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Molecular beam epitaxial growth of ZnSe films on vicinal GaAs(110) substrates
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Author keywords
Atomic force microscopy; Molecular beam epitaxy; Photoluminescence; Reflection high energy electron diffraction; Vicinal GaAs(110) substrates; ZnSe films
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FILM GROWTH;
MOLECULAR BEAM EPITAXY;
MORPHOLOGY;
PHOTOLUMINESCENCE;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SEMICONDUCTING GALLIUM ARSENIDE;
SURFACE STRUCTURE;
CRYSTAL QUALITY;
ZINC SELENIDE;
SEMICONDUCTING ZINC COMPOUNDS;
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EID: 0032662405
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.1339 Document Type: Article |
Times cited : (3)
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References (11)
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