Interface composition and stacking fault density in II-VI/III-V heterostructures

Applied Physics Letters

Volumn 70, Issue 2, 1997, Pages 237-239

  Heun, S ^a,b   Paggel, J J ^a,b,d   Sorba, L ^a,b,c   Rubini, S ^a,b   Franciosi, A ^a,b,e   Bonard, J M ^c   Ganiere J D ^c  

^a LABORATORIO TASC   (Italy)

^b University of Minnesota   (United States)

^c EPFL   (Switzerland)

^d PHILIPPS UNIVERSITY MARBURG   (Germany)

^e UNIVERSITY OF TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001503905     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118338     Document Type: Article

References (17)

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16. Minimum contrast is expected when g·b=0 for dislocations and g·R=0 or integer for the stacking faults, where g identifies the reflection employed, b is the Burgers vector of the partial dislocation, and R the displacement vector of the stacking fault. See G. Thomas and M. J. Goringe, Transmission Electron Microscopy of Materials (Wiley, New York, 1979). More detail will be provided in a forthcoming paper authored by J.-M. Bonard, J.-D. Ganière, S. Heun, J. J. Paggel, L. Sorba, S. Rubini, and A. Franciosi (unpublished).
17. Minimum contrast is expected when g·b=0 for dislocations and g·R=0 or integer for the stacking faults, where g identifies the reflection employed, b is the Burgers vector of the partial dislocation, and R the displacement vector of the stacking fault. See G. Thomas and M. J. Goringe, Transmission Electron Microscopy of Materials (Wiley, New York, 1979). More detail will be provided in a forthcoming paper authored by J.-M. Bonard, J.-D. Ganière, S. Heun, J. J. Paggel, L. Sorba, S. Rubini, and A. Franciosi (unpublished).